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[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]
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Book Details
Author(s)
Nicola Nicolici
Publisher
Springer-Verlag New York Inc.
ISBN / ASIN
B010DSZP7G
ISBN-13
978B010DSZP78
Marketplace
United Kingdom 🇬🇧
