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[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010] Buy on Amazon

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[(Power-constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Dec-2010]

AuthorNicola Nicolici
PublisherSpringer-Verlag New York Inc.
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Book Details

Author(s)Nicola Nicolici
PublisherSpringer-Verlag New York Inc.
ISBN / ASINB010DSZP7G
ISBN-13978B010DSZP78
MarketplaceUnited States  🇺🇸

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[(Power-constrained Testing of Vlsi Circuits: A Guide to the IEEE 1149.4 Test Standard )] [Author: Nicola Nicolici] [Apr-2003]
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